Discrimination of dynamically and post-dynamically recrystallized grains based on EBSD data: application to Inconel 718

The importance of angular resolution in EBSD analyses is discussed based on an Inconel 718 sample containing several populations of recrystallized grains, with subtle differences in dislocation contents. Classical EBSD analyses (with angular resolution in the range of 0.5-1 degrees) do not allow for distinguishing recrystallized grains grown dynamically or post-dynamically. The angular resolution of EBSD orientation and misorientation data can be significantly improved (down to about 0.1-0.2 degrees) either using more sophisticated Kikuchi pattern indexing methods and/or using the recently proposed LLASS denoising filter (Local Linear Automatic Smoothing Splines). Then the coexistence of both dynamically and post-dynamically recrystallized grains in the sample can be confirmed and quantified. ECCI images unambiguously confirm the conclusions drawn from the analysis of improved angular resolution EBSD data, and furthermore reveal the presence of thermal stress induced dislocations with typical patterns in water quenched Inconel 718 recrystallized grains.