Quantitative Correlation between Electrical Resistivity and Microhardness of Cu-Ni-Mo Alloys via a Short-Range Order Cluster Model

Title
Quantitative Correlation between Electrical Resistivity and Microhardness of Cu-Ni-Mo Alloys via a Short-Range Order Cluster Model
Authors
Keywords
Electrical resistivity, hardness, cluster-plus-glue-atom model, short-range order, Cu alloys
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 48, Issue 1, Pages 312-320
Publisher
Springer Nature
Online
2018-10-05
DOI
10.1007/s11664-018-6709-4

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