Journal
APPLIED PHYSICS LETTERS
Volume 113, Issue 26, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.5079763
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Funding
- JSPS KAKENHI [18K04937]
- Grants-in-Aid for Scientific Research [18K04937] Funding Source: KAKEN
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Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a metal detector at the nanometer scale and for contactless measurements of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing the determination of the best frequency for the phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed. Published by AIP Publishing.
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