4.8 Article

UV-Protective TiO2 Thin Films with High Transparency in Visible Light Region Fabricated via Atmospheric-Pressure Plasma-Enhanced Chemical Vapor Deposition

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 10, Issue 49, Pages 42657-42665

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.8b15572

Keywords

atmospheric-pressure plasma; plasma-enhanced chemical vapor deposition; plasma jet; TiO2 film; UV-protective

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This article focuses on control of film thickness and roughness to improve the ultraviolet (UV)-protective performance of TiO2 films prepared by atmospheric-pressure plasma-enhanced chemical vapor deposition using titanium (IV) isopropoxide (TTIP) as the precursor and argon as the plasma working gas. The relationship between the film morphology and UV-protective performance suggested that a decrease in roughness is the key factor to achieve performance improvement. The effects of substrate temperature and precursor concentration were investigated, and the results showed that an increase in both substrate temperature and precursor concentration reduced the roughness and improved the transparency to visible light without reducing the ability to block UV light. Finally, a TiO2 film with greater than 99% UV light blockage and greater than 95% transmittance of visible light was obtained.

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