Performance and Reliability Improvement under High Current Densities in Black Phosphorus Transistors by Interface Engineering

Published 2018 View Full Article

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Title
Performance and Reliability Improvement under High Current Densities in Black Phosphorus Transistors by Interface Engineering
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume 11, Issue 1, Pages 1587-1594
Publisher
American Chemical Society (ACS)
Online
2018-12-13
DOI
10.1021/acsami.8b16507

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