4.0 Article

Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography

Journal

MICROSCOPY
Volume 64, Issue 5, Pages 369-375

Publisher

OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfv021

Keywords

in situ transmission electron microscopy; in situ deformation; electron tomography; dynamic 3D observation

Categories

Funding

  1. Ministry of Education, Culture, Sports, Science, and Technology (MEXT) [25102703]
  2. Japan Science Technology Agency (JST) 'Development of systems and technology for advanced measurement and analysis' program
  3. Grants-in-Aid for Scientific Research [25102703] Funding Source: KAKEN

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We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 x 10(-6) and 5.2 x 10(-3) s(-1). We have also confirmed that the maximum tilt angle of the specimen holder reaches +/- 60 degrees with a rectangular shape aluminum specimen. The new specimen holder, termed as 'straining and tomography holder', will have wide range potential applications in materials science.

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