Atomic-resolution environmental TEM for quantitativein-situmicroscopy in materials science

Title
Atomic-resolution environmental TEM for quantitativein-situmicroscopy in materials science
Authors
Keywords
-
Journal
Microscopy
Volume 62, Issue 1, Pages 193-203
Publisher
Oxford University Press (OUP)
Online
2013-01-17
DOI
10.1093/jmicro/dfs096

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