Ronchi test for characterization of X-ray nanofocusing optics and beamlines

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

(2012) Daniel Nilsson et al.   OPTICS LETTERS

Two-Dimensional X-Ray Beam Phase Sensing

(2012) Sébastien Bérujon et al.   PHYSICAL REVIEW LETTERS

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

(2011) Susanne Hönig et al.   OPTICS EXPRESS

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

(2011) Joan Vila-Comamala et al.   OPTICS EXPRESS

Coherent imaging at the Diamond beamline I13

(2011) Christoph Rau et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Hard x-ray nanobeam characterization by coherent diffraction microscopy

(2010) A. Schropp et al.   APPLIED PHYSICS LETTERS

EUV Hartmann sensor for wavefront measurements at the Free-electron LASer in Hamburg

(2010) Bernhard Flöter et al.   NEW JOURNAL OF PHYSICS

Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data

(2010) Cameron M. Kewish et al.   OPTICS EXPRESS

Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

(2010) Cameron M. Kewish et al.   ULTRAMICROSCOPY