4.2 Article

Performance of a silicon monochromator under high heat load

Journal

JOURNAL OF SYNCHROTRON RADIATION
Volume 21, Issue -, Pages 315-324

Publisher

WILEY-BLACKWELL
DOI: 10.1107/S1600577513033158

Keywords

X-ray optics; high-heat-load optics; silicon monochromator; cryogenic cooling

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The performance of a cryogenically cooled double-crystal silicon monochromator was studied under high-heat-load conditions with total absorbed powers and power densities ranging from 8 to 780 W and from 8 to 240 W mm(-2), respectively. When the temperature of the first crystal is maintained close to the temperature of zero thermal expansion of silicon, the monochromator shows nearly ideal performance with a thermal slope error of 0.6 mu rad. By tuning the size of the first slit, the regime of the ideal performance can be maintained over a wide range of heat loads, i.e. from power densities of 110 W mm (2) (at total absorbed power of 510 W) to 240 W mm (2) (at total absorbed power of 240 W).

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