Journal
APL MATERIALS
Volume 2, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4890055
Keywords
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Funding
- National Research Council
- University of Maryland [70NANB10H193]
- National Institute of Standards and Technology Center for Nanoscale Science and Technology through the University of Maryland [70NANB10H193]
- Center for Energy Efficient Electronics Science (NSF) [0939514]
- Maryland NanoCenter and its NanoLab
- NSF [NSF-DMR-1104484]
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By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underlying ferroelectric substrate upon which it is grown. Simultaneous imaging allows straightforward, quantitative measurements of the correlations in these complex multiferroic systems. We have successfully imaged domains in CoFe/BFO and Fe/BTO, two systems with very different ferromagnet/ferroelectric coupling mechanisms, demonstrating how this technique provides a new local probe of magneto electric/strictive effects in multiferroic heterostructures. (C) 2014 Author(s).
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