Focused-ion-beam induced damage in thin films of complex oxide BiFeO3

Title
Focused-ion-beam induced damage in thin films of complex oxide BiFeO3
Authors
Keywords
-
Journal
APL Materials
Volume 2, Issue 2, Pages 022109
Publisher
AIP Publishing
Online
2014-02-28
DOI
10.1063/1.4866051

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More