Journal
APL MATERIALS
Volume 1, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4820427
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Funding
- Los Alamos National Laboratory Directed Research and Development (LDRD) [20130745ECR]
- Los Alamos National LDRD [DR20110029]
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Using an atomistic-phase field dislocation dynamics model, we isolate and investigate grain size and stress effects on the stacking fault width created by partial dislocation emission from a boundary. We show that the nucleation stress for a Shockley partial is governed by size of the boundary defect and insensitive to grain size. We reveal a grain size regime in which the maximum value the stacking fault width attains increases with grain size. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
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