Silicon Mirrors for High-Intensity X-Ray Pump and Probe Experiments

Plasmon measurements with a seeded x-ray laser

(2013) L B Fletcher et al.   Journal of Instrumentation

Fourier-transform inelastic X-ray scattering from time- and momentum-dependent phonon–phonon correlations

(2013) M. Trigo et al.   Nature Physics

Investigation of ablation thresholds of optical materials using 1-µm-focusing beam at hard X-ray free electron laser

(2013) Takahisa Koyama et al.   OPTICS EXPRESS

Chirped Seeded Free-Electron Lasers: Self-Standing Light Sources for Two-Color Pump-Probe Experiments

(2013) Giovanni De Ninno et al.   PHYSICAL REVIEW LETTERS

Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography

(2013) W. Wierzchowski et al.   RADIATION PHYSICS AND CHEMISTRY

Ultrafast Transitions from Solid to Liquid and Plasma States of Graphite Induced by X-Ray Free-Electron Laser Pulses

(2012) S. P. Hau-Riege et al.   PHYSICAL REVIEW LETTERS

Femtosecond Dynamics of the Collinear-to-Spiral Antiferromagnetic Phase Transition in CuO

(2012) S. L. Johnson et al.   PHYSICAL REVIEW LETTERS

Femtosecond X-Ray Pulse Characterization in Free-Electron Lasers Using a Cross-Correlation Technique

(2012) Y. Ding et al.   PHYSICAL REVIEW LETTERS

Direct Measurements of the Ionization Potential Depression in a Dense Plasma

(2012) O. Ciricosta et al.   PHYSICAL REVIEW LETTERS

Femtosecond X-ray protein nanocrystallography

(2011) Henry N. Chapman et al.   NATURE

Radiation damage in protein serial femtosecond crystallography using an x-ray free-electron laser

(2011) Lukas Lomb et al.   PHYSICAL REVIEW B

First lasing and operation of an ångstrom-wavelength free-electron laser

(2010) P. Emma et al.   Nature Photonics

The Coherent X-ray Imaging (CXI) instrument at the Linac Coherent Light Source (LCLS)

(2010) Sébastien Boutet et al.   NEW JOURNAL OF PHYSICS

Damage in solids irradiated by a single shot of XUV free-electron laser: Irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy

(2009) J.B. Pelka et al.   RADIATION PHYSICS AND CHEMISTRY