Journal
MATERIALS SCIENCE-POLAND
Volume 33, Issue 3, Pages 491-496Publisher
SCIENDO
DOI: 10.1515/msp-2015-0062
Keywords
ZnO; spray deposition; Rutherford Backscattering Spectrometry (RBS); structural, optical and electrical properties
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Undoped ZnO thin films have been prepared on glass substrates at different substrate temperatures by spray pyrolysis method. The effect of temperature on the structural, morphological and optical properties of n-type ZnO films was studied. The X-ray diffraction (XRD) results confirmed that the ZnO thin films were polycrystalline with wurtzite structure. Scanning electron microscopy (SEM) measurements showed that the surface morphology of the films changed with temperature. The studies demonstrated that the ZnO film had a transmission of about 85 % and energy gap of 3.28 eV at 450 degrees C. The RBS measurements revealed that ZnO layers with a thickness up to 200 nm had a good stoichiometry.
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