Application of synchrotron through-the-substrate microdiffraction to crystals in polished thin sections

Application of Patterson-function direct methods to materials characterization

(2014) Jordi Rius   IUCrJ

The indexing ambiguity in serial femtosecond crystallography (SFX) resolved using an expectation maximization algorithm

(2014) Haiguang Liu et al.   IUCrJ

The new Material Science Powder Diffraction beamline at ALBA Synchrotron

(2013) F. Fauth et al.   POWDER DIFFRACTION

Patterson function and δ recycling: derivation of the phasing equations

(2012) Jordi Rius   ACTA CRYSTALLOGRAPHICA SECTION A

DAJUST: a suite of computer programs for pattern matching, space-group determination and intensity extraction from powder diffraction data

(2012) Oriol Vallcorba et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Direct phasing from Patterson syntheses by δ recycling

(2011) Jordi Rius   ACTA CRYSTALLOGRAPHICA SECTION A

Capabilities of through-the-substrate microdiffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

(2011) Jordi Rius et al.   JOURNAL OF SYNCHROTRON RADIATION

Multigrain crystallography

(2011) Henning O. Sørensen et al.   ZEITSCHRIFT FUR KRISTALLOGRAPHIE

Towards automated diffraction tomography. Part II—Cell parameter determination

(2008) U. Kolb et al.   ULTRAMICROSCOPY