Effect of Threading Dislocations on the Quality Factor of InGaN/GaN Microdisk Cavities

Title
Effect of Threading Dislocations on the Quality Factor of InGaN/GaN Microdisk Cavities
Authors
Keywords
-
Journal
ACS Photonics
Volume 2, Issue 1, Pages 137-143
Publisher
American Chemical Society (ACS)
Online
2014-12-18
DOI
10.1021/ph500426g

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