Atomic force microscopy analysis of nanoparticles in non-ideal conditions

Title
Atomic force microscopy analysis of nanoparticles in non-ideal conditions
Authors
Keywords
-
Journal
Nanoscale Research Letters
Volume 6, Issue 1, Pages 514
Publisher
Springer Nature
Online
2011-08-31
DOI
10.1186/1556-276x-6-514

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started