Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination

Published 2014 View Full Article

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Title
Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 4, Issue 3, Pages 834-840
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-03-28
DOI
10.1109/jphotov.2014.2300238

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