Investigation of Lifetime-Limiting Defects After High-Temperature Phosphorus Diffusion in High-Iron-Content Multicrystalline Silicon

Authors

Keywords

Journal

Volume 4, Issue 3, Pages 866-873

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2014-04-18

DOI

10.1109/jphotov.2014.2312485

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started