The Impact of Different Diffusion Temperature Profiles on Iron Concentrations and Carrier Lifetimes in Multicrystalline Silicon Wafers

Published 2012 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
The Impact of Different Diffusion Temperature Profiles on Iron Concentrations and Carrier Lifetimes in Multicrystalline Silicon Wafers
Authors
Keywords
-
Journal
IEEE Journal of Photovoltaics
Volume 3, Issue 2, Pages 635-640
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-12-28
DOI
10.1109/jphotov.2012.2231726

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.