Modeling Recombination at the Si–Al$_{2}$O $_{3}$ Interface

Title
Modeling Recombination at the Si–Al$_{2}$O $_{3}$ Interface
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 3, Issue 3, Pages 936-943
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-03-12
DOI
10.1109/jphotov.2013.2247464

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