Investigating Internal Gettering of Iron at Grain Boundaries in Multicrystalline Silicon via Photoluminescence Imaging

Title
Investigating Internal Gettering of Iron at Grain Boundaries in Multicrystalline Silicon via Photoluminescence Imaging
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 2, Issue 4, Pages 479-484
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-07-11
DOI
10.1109/jphotov.2012.2195550

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