Stability of low-carrier-density topological-insulator Bi2Se3 thin films and effect of capping layers

Title
Stability of low-carrier-density topological-insulator Bi2Se3 thin films and effect of capping layers
Authors
Keywords
-
Journal
APL Materials
Volume 3, Issue 9, Pages 091101
Publisher
AIP Publishing
Online
2015-09-29
DOI
10.1063/1.4931767

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now