Raman Scattering and Backscattering Studies of Silicon Nanocrystals Formed Using Sequential Ion Implantation

Title
Raman Scattering and Backscattering Studies of Silicon Nanocrystals Formed Using Sequential Ion Implantation
Authors
Keywords
Silicon nanocrystals, Raman Scattering, Ion implantation, Rutherford backscattering, Phonon confinement model
Journal
Silicon
Volume 6, Issue 1, Pages 65-71
Publisher
Springer Nature
Online
2013-07-16
DOI
10.1007/s12633-013-9157-z

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