X-ray photoelectron spectroscopy study of high-k CeO2/La2O3 stacked dielectrics

Current conduction and stability of CeO2/La2O3 stacked gate dielectric

(2012) Hei Wong et al.   APPLIED PHYSICS LETTERS

Stoichiometry–structure correlation of epitaxial Ce1−xPrxO2−δ (x=0−1) thin films on Si(111)

(2012) Marvin Hartwig Zoellner et al.   JOURNAL OF CRYSTAL GROWTH

Improving the electrical characteristics of MOS transistors with CeO2/La2O3 stacked gate dielectric

(2011) B.L. Yang et al.   MICROELECTRONICS RELIABILITY

Properties of CeOx/La2O3 gate dielectric and its effects on the MOS transistor characteristics

(2011) H. Wong et al.   VACUUM

Effects of aluminum doping on lanthanum oxide gate dielectric films

(2011) Hei Wong et al.   VACUUM

Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy

(2010) S. Inamoto et al.   JOURNAL OF APPLIED PHYSICS

XPS Study of the Bonding Properties of Lanthanum Oxide/Silicon Interface with a Trace Amount of Nitrogen Incorporation

(2010) H. Wong et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Advantage of further scaling in gate dielectrics below 0.5nm of equivalent oxide thickness with La2O3 gate dielectrics

(2010) K. Kakushima et al.   MICROELECTRONICS RELIABILITY

Effect of La2O3 on Ru/CeO2-La2O3 Catalyst for Ammonia Synthesis

(2009) Xiaojun Luo et al.   CATALYSIS LETTERS

Photoluminescence enhancement induced by nanoparticles from La2O3 and CeO2 doped diamond-like carbon films

(2008) Zhenyu Zhang et al.   JOURNAL OF ALLOYS AND COMPOUNDS