Journal
ACS MACRO LETTERS
Volume 1, Issue 11, Pages 1317-1320Publisher
AMER CHEMICAL SOC
DOI: 10.1021/mz300391g
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- Ministry of Education, Culture, Sports, Science and Technology, Japan [24350061]
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The glass transition temperature (T-g) of thin polystyrene (PS) films supported on silicon wafers with oxide layers of varying thickness was characterized by the temperature dependence of the film thickness using ellipsometry. This allowed us to uncover how a long-range interaction affects the T-g of polymer films. As previously reported using a variety of methods, the T-g decreased with decreasing film thickness. However, the extent was not the same among the reports. In this study, we found that the T-g attenuation of a PS film of a given thickness was dependent on the oxide layer thickness of the silicon wafer via the long-range interaction.
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