Random variability modeling and its impact on scaled CMOS circuits

Published 2010 View Full Article

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Title
Random variability modeling and its impact on scaled CMOS circuits
Authors
Keywords
-
Journal
Journal of Computational Electronics
Volume 9, Issue 3-4, Pages 108-113
Publisher
Springer Nature
Online
2010-10-26
DOI
10.1007/s10825-010-0336-5

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