NEXAFS and XPS study of GaN formation on ion-bombarded GaAs surfaces

Title
NEXAFS and XPS study of GaN formation on ion-bombarded GaAs surfaces
Authors
Keywords
-
Journal
VACUUM
Volume 84, Issue 1, Pages 41-44
Publisher
Elsevier BV
Online
2009-04-13
DOI
10.1016/j.vacuum.2009.04.024

Ask authors/readers for more resources

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started