Characterization of interface states at Au/SnO2/n-Si (MOS) structures

Published 2008 View Full Article

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Title
Characterization of interface states at Au/SnO2/n-Si (MOS) structures
Authors
Keywords
-
Journal
VACUUM
Volume 82, Issue 11, Pages 1203-1207
Publisher
Elsevier BV
Online
2008-04-16
DOI
10.1016/j.vacuum.2007.12.014

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