Journal
ULTRAMICROSCOPY
Volume 145, Issue -, Pages 13-21Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2013.11.010
Keywords
Radiation damage; Electron microscopy; Low-dimensional materials; Maximum likelihood reconstructions
Categories
Funding
- Austrian Science Fund FWF [M1481-N20, 11283-N20]
- Austrian Science Fund (FWF) [I1283, M1481] Funding Source: Austrian Science Fund (FWF)
- Austrian Science Fund (FWF) [I 1283, M 1481] Funding Source: researchfish
Ask authors/readers for more resources
Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations. (C) 2013 The Authors. Published by Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available