Journal
ULTRAMICROSCOPY
Volume 130, Issue -, Pages 87-93Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2013.04.007
Keywords
Ceria; Low-energy electron microscopy and diffraction; Oxide films; Rare-earth oxides
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The growth of cerium oxide on Ru(0001) by reactive molecular beam epitaxy has been investigated using low-energy electron microscopy (LEEM) and diffraction as well as local valence band photoemission. The oxide islands are found to adopt a carpet-like growth mode, which depending on the local substrate morphology and misorientation leads to deviations from the otherwise almost perfect equilateral shape at a growth temperature of 850 degrees C. Furthermore, although even at this high growth temperature the micron-sized CeO2(111) islands are found to exhibit different lattice registries with respect to the hexagonal substrate, the combination of dark-field LEEM and local intensity-voltage analysis reveals that the oxidation state of the islands is homogeneous down to the 10 nm scale. (C) 2013 Elsevier BY. All rights reserved.
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