4.4 Article

EEL spectroscopic tomography: Towards a new dimension in nanomaterials analysis

Journal

ULTRAMICROSCOPY
Volume 122, Issue -, Pages 12-18

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2012.07.020

Keywords

Tomography; STEM; EELS; Core-loss; MVA; PCA; ICA

Categories

Funding

  1. Spanish Ministry of Science and Innovation [CSD 2009-0013, MAT2010-16407]
  2. Nanoaracat Aragon-Catalonian cooperation program
  3. ICREA Funding Source: Custom

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Electron tomography is a widely spread technique for recovering the three dimensional (3D) shape of nanostructured materials. Using a spectroscopic signal to achieve a reconstruction adds a fourth chemical dimension to the 3D structure. Up to date, energy filtering of the images in the transmission electron microscope (EFTEM) is the usual spectroscopic method even if most of the information in the spectrum is lost. Unlike EFTEM tomography, the use of electron energy-loss spectroscopy (EELS) spectrum images (SI) for tomographic reconstruction retains all chemical information, and the possibilities of this new approach still remain to be fully exploited. In this article we prove the feasibility of EEL spectroscopic tomography at low voltages (80 kV) and short acquisition times from data acquired using an aberration corrected instrument and data treatment by Multivariate Analysis (MVA), applied to FexCo(3-x)O4@Co3O4 mesoporous materials. This approach provides a new scope into materials; the recovery of full EELS signal in 3D. (C) 2012 Elsevier B.V. All rights reserved.

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