Improving the reliability of the background extrapolation in transmission electron microscopy elemental maps by using three pre-edge windows

Published 2012 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Improving the reliability of the background extrapolation in transmission electron microscopy elemental maps by using three pre-edge windows
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 118, Issue -, Pages 11-16
Publisher
Elsevier BV
Online
2012-05-08
DOI
10.1016/j.ultramic.2012.04.009

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.