Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination

Title
Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 111, Issue 2, Pages 149-154
Publisher
Elsevier BV
Online
2010-11-08
DOI
10.1016/j.ultramic.2010.10.017

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