A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM

Title
A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 111, Issue 8, Pages 1029-1036
Publisher
Elsevier BV
Online
2011-03-09
DOI
10.1016/j.ultramic.2011.03.001

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