Journal
ULTRAMICROSCOPY
Volume 111, Issue 4, Pages 273-281Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2010.11.029
Keywords
Cathode lens; Aberrations; Aberration correction
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In this paper I discuss several theoretical and practical aspects related to measuring and correcting the chromatic and spherical aberrations of a cathode objective lens as used in Low Energy Electron Microscopy (LEEM) and Photo Electron Emission Microscopy (PEEM) experiments. Special attention is paid to the various components of the cathode objective lens as they contribute to chromatic and spherical aberrations, and affect practical methods for aberration correction. This analysis has enabled us to correct a LEEM instrument for the spherical and chromatic aberrations of the objective lens. (C) 2010 Elsevier B.V. All rights reserved.
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