Journal
ULTRAMICROSCOPY
Volume 111, Issue 1, Pages 62-65Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2010.09.011
Keywords
Nanoporous; Thickness; EELS
Categories
Funding
- NSF [DMR0603993]
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This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system. (C) 2010 Elsevier B.V. All rights reserved.
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