Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images

Published 2010 View Full Article

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Title
Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 110, Issue 6, Pages 634-638
Publisher
Elsevier BV
Online
2010-02-24
DOI
10.1016/j.ultramic.2010.02.024

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