Bandgap measurement of thin dielectric films using monochromated STEM-EELS

Title
Bandgap measurement of thin dielectric films using monochromated STEM-EELS
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 109, Issue 9, Pages 1183-1188
Publisher
Elsevier BV
Online
2009-05-14
DOI
10.1016/j.ultramic.2009.04.005

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