A model of secondary electron imaging in the helium ion scanning microscope

Published 2009 View Full Article

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Title
A model of secondary electron imaging in the helium ion scanning microscope
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 109, Issue 6, Pages 748-757
Publisher
Elsevier BV
Online
2009-02-11
DOI
10.1016/j.ultramic.2009.01.013

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