Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy

Title
Microelectrical characterizations of junctions in solar cell devices by scanning Kelvin probe force microscopy
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 109, Issue 8, Pages 952-957
Publisher
Elsevier BV
Online
2009-04-07
DOI
10.1016/j.ultramic.2009.03.048

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