Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector

Title
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 109, Issue 9, Pages 1144-1147
Publisher
Elsevier BV
Online
2009-05-19
DOI
10.1016/j.ultramic.2009.05.005

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