X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope

Published 2008 View Full Article

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Title
X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 108, Issue 11, Pages 1427-1431
Publisher
Elsevier BV
Online
2008-06-16
DOI
10.1016/j.ultramic.2008.05.011

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