Nano-Mechanical Properties of Modified Poly(Methyl Methacrylate) Films Studied by Atomic Force Microscopy

Atomic force microscopy (AFM) has been used to study the effect of various photoinitiators doped into poly(methyl methacrylate) (PMMA) on the mechanical properties of PMMA films at the nanometer scale. Pure and modified PMMA films (containing four different photoinitiators) were exposed to a mercury vapor lamp in air atmosphere. Force-distance curves for hardness, Young modulus, and adhesion forces were obtained using different AFM modes (tapping or contact-mode) and different tips (diamond or silicon nitride). The results revealed that the added photoinitiators slightly changed the nanomechanical properties of PMMA as a result of alterations in the photochemical reactions and physical processes occurring in the studied systems. tert-Butyl peroxybenzoate had the most efficient effect on the measured parameters in UV-irradiated PMMA, whereas benzoyl peroxide was less active. The mechanism of the observed processes is discussed.