Non-invasive Imaging of Stem Cells by Scanning Ion Conductance Microscopy: Future Perspective

Title
Non-invasive Imaging of Stem Cells by Scanning Ion Conductance Microscopy: Future Perspective
Authors
Keywords
-
Journal
TISSUE ENGINEERING PART C-METHODS
Volume 14, Issue 4, Pages 311-318
Publisher
Mary Ann Liebert Inc
Online
2008-12-04
DOI
10.1089/ten.tec.2008.0058

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