Journal
THIN SOLID FILMS
Volume 553, Issue -, Pages 71-75Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2013.11.036
Keywords
Thin films; Oxide; Ferroelectric; X-ray diffraction; Pulsed laser deposition; Piezoresponse force microscopy
Categories
Funding
- Fonds Europeen de Developpement Regional (FEDER)
- CNRS
- Region Nord Pas-de-Calais
- Ministere de l'Education Nationale de l'Enseignement Superieur et de la Recherche
- C'Nano Nord-Ouest competence center
Ask authors/readers for more resources
Ferroelectric lead-free Ln(2)Ti(2)O(7) thin films (Ln = La, Pr and Nd) have been grown on (110)-oriented SrTiO3 substrates by pulsed laser deposition. The X-ray diffraction study reveals that all films are highly (00l)-oriented. This is in good agreement with the compatibility between the film/substrate crystal lattices. The Williamson-Hall plots evidence the effect of the Ln(3+) cation size on the micro-strain in the film while the average size of the crystallites deduced from these plots is shown to correlate the average size of the dense grains, as observed by atomic force microscopy. Finally, through piezoloops recording carried out by piezoresponse force microscopy, nanoscale ferroelectricity is highlighted in these layered-perovskite Ln(2)Ti(2)O(7) films. These results confirm that these lead-free oxides can be used as functional material in nanoelectronic devices. (C) 2013 Elsevier B. V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available