Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

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Title
Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 562, Issue -, Pages 109-113
Publisher
Elsevier BV
Online
2014-04-05
DOI
10.1016/j.tsf.2014.03.079

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