Optical and structural characterization of SnO2:F/SiCxOy tandem thin films by spectroscopic ellipsometry

Title
Optical and structural characterization of SnO2:F/SiCxOy tandem thin films by spectroscopic ellipsometry
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 540, Issue -, Pages 84-91
Publisher
Elsevier BV
Online
2013-06-21
DOI
10.1016/j.tsf.2013.06.031

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started