4.4 Article

Growth of single-phase Mg0.3Zn0.7O films suitable for solar-blind optical devices on RS-MgO substrates

Journal

THIN SOLID FILMS
Volume 520, Issue 6, Pages 1705-1708

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2011.08.019

Keywords

Magnesium zinc oxide; Molecular beam epitaxy; Magnesium oxide; Solar-blind; Rutherford backscattering spectrometry; X-ray diffraction

Funding

  1. National Science Foundation [61076007, 50532090, 60606023]
  2. Ministry of Science and Technology of China [2007CB936203, 2009CB929400, 2009AA033101, 2011CB302002]
  3. Chinese Academy of Sciences
  4. Diffusion Scattering Station in Beijing Synchrotron Radiation Facility
  5. Research Council of Norway

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Single-phase rock-salt Mg0.3Zn0.7O film was fabricated on MgO (100) substrate by radio-frequency plasma assisted molecular beam epitaxy. A smooth surface was observed by in-situ reflection high-energy electron diffraction and ex-situ atomic force microscopy. X-ray diffraction characterization demonstrated a high-quality single-phase structure with highly (200) orientation and cube-on-cube epitaxial relationship. Zn fraction in the single-phase rock-salt Mg0.3Zn0.7O film was determined by Rutherford backscattering spectrometry. Optical property of the film was investigated by reflectance spectroscopy, which indicated a solar-blind band gap of 255.5 nm. The reason why Zn solubility limit is greatly enhanced in non-polar (100) film compared with (111) polar epilayer is tentatively discussed in this work, suggesting MgO (100) is more suitable for the synthesis of single-phase rock-salt MgZnO with high Zn content towards solar-blind opto-device applications. (c) 2011 Elsevier B.V. All rights reserved.

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