Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry

Title
Band alignment of metal-oxide-semiconductor structure by internal photoemission spectroscopy and spectroscopic ellipsometry
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 519, Issue 9, Pages 2811-2816
Publisher
Elsevier BV
Online
2010-12-12
DOI
10.1016/j.tsf.2010.11.080

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started